NAND Flash Bad Block Schemes

Field Proven
Skip Block method is the default scheme
Runs under TLWIN
References device specs from the semiconductor manufacturers
General schemes (Reserved Block Area, Samsung GBBM...)
Also developed for unique customer applications

Product Specification (PDF)

Data I/O’s NAND Flash Bad-Block Schemes software option is for engineers and systems designers implementing NAND Flash memories into their electronic products.

New products increasingly use NAND Flash memories instead of NOR Flash memories due to the large cost advantage.

While NOR memories are error-free, NAND memories require bad-blocks to be detected and managed while writing to the device.

About two dozen methods are commonly used to manage bad-blocks today. The “Skip Bad-Blocks” scheme is included with TaskLink™.

The NAND Flash Bad-Block Schemes software option package contains numerous new sophisticated schemes.

Data I/O offers this software option to help designers more quickly implement products on NAND Flash memories with proven bad-block handling methods.